Archive For July 4, 2008

Fe-NAND Flash: 10x Durability, 30% Programming Voltage, & 2 Additional Feature Reductions

Recently results from two academic researchers in Japan will be significant to the NAND Flash market: http://www.electronicsweekly.com/Articles/Article.aspx?liArticleID=44028&PrinterFriendly=true. Clearly the trip from laboratory to volume production is often longer than the early estimates but these results look important. Back in 2006, Jim Gray argued in Tape is Dead, Disk is Tape, Flash is Disk, & Ram…

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