NAND Flash Random Write Performance Improves

Yesterday, Intel and Micron announced a generational step forward in NAND Flash Write I/O performance. From the Intel Press release:

The new high speed NAND can reach speeds up to 200 megabytes per second (MB/s) for reading data and 100 MB/s for writing data, achieved by leveraging the new ONFI 2.0 specification and a four-plane architecture with higher clock speeds. In comparison, conventional single level cell NAND is limited to 40 MB/s for reading data and less than 20 MB/s for writing data.

They don’t actually say it’s an SLC device but they compare it to SLC and it has the typical wear characteristics of SLC (100,000 cycles). More data from the Micron web site:

Features

Benefits

Density

8Gb–16Gb

Industry-standard densities

Performance

200 MB/s Sustained READ
100 MB/s Sustained WRITE
1.5ms (TYP) Erase Performance

Delivers the fastest read and write throughputs ever for a NAND Flash device

Endurance (cycles)

100,000

High-endurance enables applications that require intensive program and erase operation while prolonging memory life

Interface

Async/Sync
ONFI 1.0/2.0

Standard interface enables a high degree of interoperability

Temperature Range

−25˚C to +85˚C

Wide temperature range is ideal for rugged environments

Configuration

1.8V, x8

Industry-standard configuration enables easy system design

Package

100-ball BGA

Industry-standard packaging enables easier density migration

Expect shipments in the latter half of 2008. We should start seeing interesting applications of this technology in SSDs and other devices this year.

Intel Press Release: http://www.intel.com/pressroom/archive/releases/20080201corp.htm

More data from Micron: http://www.micron.com/products/nand/high_speed/index

–jrh

James Hamilton, Windows Live Platform Services
Bldg RedW-D/2072, One Microsoft Way, Redmond, Washington, 98052
W:+1(425)703-9972 | C:+1(206)910-4692 | H:+1(206)201-1859 |
JamesRH@microsoft.com

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